AUC Problem Solving with UltraScan

Advanced topics in UltraScan Data Analysis

Presenter: Borries Demeler, University of Lethbridge, Alberta, Canada and University of Montana

During this session, I will focus on advanced topics in experimental design, data analysis and result interpretation. We will review the information obtained from various analysis methods and compare and contrast what can be learned from each method (and what cannot be learned!). We will discuss the 2-dimensional spectrum analysis, custom grid method, genetic algorithms, the parametrically constrained spectrum analysis, the Monte Carlo analysis, the van Holde - Weischet analysis and discrete model genetic algorithms for fitting interacting systems and custom-built models.

I will also review strategies for maximizing experimental information by judiciously designing your experiments, and discuss caveats, tips and tricks that are often overlooked. This will be done by example using sample data from systems that illustrate the following concepts:

Another part of this workshop will look at visualizations for finite element models using 2-dimensional and 3-dimensional plotting procedures, and if time permits, I'll present advanced topics in multi-wavelength analysis and cover how publication-quality custom graphs can be generated with UltraScan.

This workshop will be presented in sessions 7-10.

Please note:

  1. The introductory UltraScan session is a prerequisite for participation in the advanced session unless prior arrangements have been made with the workshop presenter.
  2. Workshop participants must bring a wifi capable laptop with the latest version of UltraScan installed on it, and registered a LIMS account in the UltraScan Demo LIMS instance.